Characterization of wafers by V(Z) curve technique of scanning acoustic microscopy

• 主要作者: Loh, Edwin Jin Wee.
• 其他作者: School of Mechanical and Aerospace Engineering
• 格式: Final Year Project
• 語言: English
• 出版: 2009
• 主題: DRNTU::Engineering::Materials::Material testing and characterization
• 在線閱讀: http://hdl.handle.net/10356/17136
• 機構: Nanyang Technological University

The report presents the work performed on the evaluation of Young’s Modulus using the V(z) curve technique. The background of V(z) curve technique in determining the material properties non-destructively is introduced. In order for readers to understand the procedures undertaken for the project, a c...