Characterization of wafers by V(Z) curve technique of scanning acoustic microscopy

• 主要作者: Loh, Edwin Jin Wee.
• 其他作者: School of Mechanical and Aerospace Engineering
• 格式: Final Year Project
• 語言: English
• 出版: 2009
• 主題: DRNTU::Engineering::Materials::Material testing and characterization
• 在線閱讀: http://hdl.handle.net/10356/17136

The report presents the work performed on the evaluation of Young’s Modulus using the V(z) curve technique. The background of V(z) curve technique in determining the material properties non-destructively is introduced. In order for readers to understand the procedures undertaken for the project, a c...