Anomaly detection for X-ray of PCB & IC images

• 主要作者: Heng, Daryl Ew-Jynn
• 其他作者: Wen Bihan
• 格式: Final Year Project
• 語言: English
• 出版: Nanyang Technological University 2024
• 主題: Engineering; PCB defect detection
• 在線閱讀: https://hdl.handle.net/10356/177102

This project investigates the use of deep learning models for defect detection in printed circuit boards and integrated circuits using YOLOv9. We developed a customized neural network model that take binary mask images and identifies defects in each image. The methodology included converting the dat...