A radiation-hardened-by-design RISC-V microcontroller

• المؤلف الرئيسي: Fang, Rouli
• مؤلفون آخرون: Chang Joseph
• التنسيق: Final Year Project
• اللغة: English
• منشور في: Nanyang Technological University 2024
• الموضوعات: Engineering; Microcontroller; RSIC-V; Digital IC; Testing; RHBD
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/177249

Digital electronics in space and high-level autonomous vehicles are required to feature an ultra-low soft error rate (SER ≤ 10FITS) – an SER unattainable by consumer-grade digital electronics. This project is part of a joint project between NTU, Zero-Error Systems Pte Ltd (ZES) and the Institute of...