Development of an ultra-fast switching charge pumping measurement method

• Main Author: Tan, Edwin Pei Ming.
• Other Authors: Ang Diing Shenp
• Format: Final Year Project
• Language: English
• Published: 2009
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
• Online Access: http://hdl.handle.net/10356/17863
• Institution: Nanyang Technological University

Advances in microelectronics has been reflected in the aggressive scaling of MOSFETS and the increased density of transistors in a given wafer area. Device miniaturization results in reduced unit cost per circuit function. As device dimensions decreases, the intrinsic switching time also decreases....