Three-dimensional modeling of near-field beam profiles from grating couplers using a deep neural network

• المؤلفون الرئيسيون: Lim, Yu Dian, Tan, Chuan Seng
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2024
• الموضوعات: Engineering; Integrated silicon photonics; Deep neural network
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/179964

Integrated silicon photonics (SiPh) gratings have been widely studied for the optical addressing of trapped ions. As the formfactor of ion traps reduces, the ion-trapping height decreases, and may unavoidably fall into the reactive near-field region of SiPh gratings. In this study, a deep neural net...