Digital Lensless microscope : MEMS application
Recent advancements in micro and nanofabrication initiated the increasing sophisticated of measurements and characterization at nanometer scale. Various kinds of measurement systems such as atomic force microscopy, scanning probe microscopy, electron microscopy are developed to characterize the mate...
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Format: | Final Year Project |
Language: | English |
Published: |
2009
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Online Access: | http://hdl.handle.net/10356/18922 |
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Institution: | Nanyang Technological University |
Language: | English |