Digital Lensless microscope : MEMS application

Recent advancements in micro and nanofabrication initiated the increasing sophisticated of measurements and characterization at nanometer scale. Various kinds of measurement systems such as atomic force microscopy, scanning probe microscopy, electron microscopy are developed to characterize the mate...

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Bibliographic Details
Main Author: Ma Myat, Thu Zar
Other Authors: Anand Krishna Asundi
Format: Final Year Project
Language:English
Published: 2009
Subjects:
Online Access:http://hdl.handle.net/10356/18922
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Institution: Nanyang Technological University
Language: English