Modeling of Eeprom

Flotox structure has been a very popular choice for storage device in EEPROM chips. In this project, two aspects of such a structure were studied; the current-voltage characteristics under DC conditions and the transient behavior.

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Bibliographic Details
Main Author: Liong, Luey Chwan.
Other Authors: Liu, Po-ching
Format: Theses and Dissertations
Language:English
Published: 2009
Subjects:
Online Access:http://hdl.handle.net/10356/19809
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Institution: Nanyang Technological University
Language: English
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