Time-series models for statistical process control (SPC)

With the objective of reducing process variability, Statistical Process Control (SPC) aims to improve a process by detecting, identifying, and removing special causes of variation. The primary SPC method used to monitor the quality of a given process is the control chart. Based on the classic work o...

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Bibliographic Details
Main Author:	Lui, Woei Wen.
Other Authors:	Spedding, Trevor
Format:	Theses and Dissertations
Language:	English
Published:	2009
Subjects:	DRNTU::Engineering::Manufacturing::Production management
Online Access:	http://hdl.handle.net/10356/19952
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Institution:	Nanyang Technological University
Language:	English

id	sg-ntu-dr.10356-19952
record_format	dspace
spelling	sg-ntu-dr.10356-199522023-03-11T16:58:28Z Time-series models for statistical process control (SPC) Lui, Woei Wen. Spedding, Trevor School of Mechanical and Production Engineering DRNTU::Engineering::Manufacturing::Production management With the objective of reducing process variability, Statistical Process Control (SPC) aims to improve a process by detecting, identifying, and removing special causes of variation. The primary SPC method used to monitor the quality of a given process is the control chart. Based on the classic work of Shewhart, the fundamental assumption used in the construction of the control chart is that the inherent process is independent and identically distributed (iid). Master of Science (Mechanics & Processing of Materials) 2009-12-14T07:52:59Z 2009-12-14T07:52:59Z 1997 1997 Thesis http://hdl.handle.net/10356/19952 en NANYANG TECHNOLOGICAL UNIVERSITY 97 p. application/pdf
institution	Nanyang Technological University
building	NTU Library
continent	Asia
country	Singapore Singapore
content_provider	NTU Library
collection	DR-NTU
language	English
topic	DRNTU::Engineering::Manufacturing::Production management
spellingShingle	DRNTU::Engineering::Manufacturing::Production management Lui, Woei Wen. Time-series models for statistical process control (SPC)
description	With the objective of reducing process variability, Statistical Process Control (SPC) aims to improve a process by detecting, identifying, and removing special causes of variation. The primary SPC method used to monitor the quality of a given process is the control chart. Based on the classic work of Shewhart, the fundamental assumption used in the construction of the control chart is that the inherent process is independent and identically distributed (iid).
author2	Spedding, Trevor
author_facet	Spedding, Trevor Lui, Woei Wen.
format	Theses and Dissertations
author	Lui, Woei Wen.
author_sort	Lui, Woei Wen.
title	Time-series models for statistical process control (SPC)
title_short	Time-series models for statistical process control (SPC)
title_full	Time-series models for statistical process control (SPC)
title_fullStr	Time-series models for statistical process control (SPC)
title_full_unstemmed	Time-series models for statistical process control (SPC)
title_sort	time-series models for statistical process control (spc)
publishDate	2009
url	http://hdl.handle.net/10356/19952
_version_	1761781321212887040

Time-series models for statistical process control (SPC)

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