Time-series models for statistical process control (SPC)

• Main Author: Lui, Woei Wen.
• Other Authors: Spedding, Trevor
• Format: Theses and Dissertations
• Language: English
• Published: 2009
• Subjects: DRNTU::Engineering::Manufacturing::Production management
• Online Access: http://hdl.handle.net/10356/19952
• Institution: Nanyang Technological University

With the objective of reducing process variability, Statistical Process Control (SPC) aims to improve a process by detecting, identifying, and removing special causes of variation. The primary SPC method used to monitor the quality of a given process is the control chart. Based on the classic work o...