Investigation and design of built-in self-test techniques for digital logic circuits

• Main Author: Wong, Eddie M. C.
• Other Authors: School of Electrical and Electronic Engineering
• Format: Research Report
• Published: 2008
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
• Online Access: http://hdl.handle.net/10356/2697
• Institution: Nanyang Technological University

The report emphasizes on the design of testing techniques for digital circuits.