Investigation and design of built-in self-test techniques for digital logic circuits

• المؤلف الرئيسي: Wong, Eddie M. C.
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: Research Report
• منشور في: 2008
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/2697
• المؤسسة: Nanyang Technological University

The report emphasizes on the design of testing techniques for digital circuits.