Automatic test chip set
In this project, the fundamental functions and basic circuitry of an universal pin electronics are investigated and designed.
Saved in:
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Research Report |
| Published: |
2008
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/10356/2713 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | Nanyang Technological University |
| id |
sg-ntu-dr.10356-2713 |
|---|---|
| record_format |
dspace |
| spelling |
sg-ntu-dr.10356-27132023-03-04T03:24:34Z Automatic test chip set Chin, Edward Hsi Ling. School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits In this project, the fundamental functions and basic circuitry of an universal pin electronics are investigated and designed. RP 35/90 2008-09-17T09:13:40Z 2008-09-17T09:13:40Z 2000 2000 Research Report http://hdl.handle.net/10356/2713 Nanyang Technological University application/pdf |
| institution |
Nanyang Technological University |
| building |
NTU Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NTU Library |
| collection |
DR-NTU |
| topic |
DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits |
| spellingShingle |
DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits Chin, Edward Hsi Ling. Automatic test chip set |
| description |
In this project, the fundamental functions and basic circuitry of an universal pin electronics are investigated and designed. |
| author2 |
School of Electrical and Electronic Engineering |
| author_facet |
School of Electrical and Electronic Engineering Chin, Edward Hsi Ling. |
| format |
Research Report |
| author |
Chin, Edward Hsi Ling. |
| author_sort |
Chin, Edward Hsi Ling. |
| title |
Automatic test chip set |
| title_short |
Automatic test chip set |
| title_full |
Automatic test chip set |
| title_fullStr |
Automatic test chip set |
| title_full_unstemmed |
Automatic test chip set |
| title_sort |
automatic test chip set |
| publishDate |
2008 |
| url |
http://hdl.handle.net/10356/2713 |
| _version_ |
1759857611682873344 |