Automatic test chip set

• Main Author: Chin, Edward Hsi Ling.
• Other Authors: School of Electrical and Electronic Engineering
• Format: Research Report
• Published: 2008
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
• Online Access: http://hdl.handle.net/10356/2713
• Institution: Nanyang Technological University

In this project, the fundamental functions and basic circuitry of an universal pin electronics are investigated and designed.