Review and analysis of device characterization structures and methodologies used for mixed signal integrated circuits

This project focues on the evaluation of the various characterization techniques and test structure designs for both active and passive component used in deep sub-micron high frequency mixed signal (analog/digital) integrated circuits. Key device parameters and matching of both passive components (r...

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Bibliographic Details
Main Author: Purakh Raj Verma.
Other Authors: Lau, Michael Wai Shing
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/3148
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Institution: Nanyang Technological University