Low dimensional semiconductor structures MOCVD growth and their characterizations
This project is on low dimensional semiconductor structures MOCVD growth and their characterizations, mainly focused on multiple quantum wells structure growth by MOCVD. Samples were characterized by using high resolution X-ray diffractions (XRD) and photoluminescence (PL). In this dissertation, pro...
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格式: | Theses and Dissertations |
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2008
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在線閱讀: | http://hdl.handle.net/10356/3278 |
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機構: | Nanyang Technological University |