Characterization and modeling of negative bias temperature instability in P-MOSFETs

• 主要作者: Yang, Jianbo
• 其他作者: Chen Tupei
• 格式: Theses and Dissertations
• 語言: English
• 出版: 2010
• 主題: DRNTU::Engineering::Electrical and electronic engineering::Semiconductors
• 在線閱讀: https://hdl.handle.net/10356/35246

This thesis is concerned with the study of negative bias temperature instability (NBTI) in p-MOSFETs. A simple characterization method based on the single-point measurement of the saturated drain current is first proposed to minimize the unwanted recovery effect during the NBTI measurement. A study...