Material characterization and device design of TiNx infrared microemitter

This thesis systematically studies the electrical and thermal properties of TiN films deposited by the filtered arc deposition (FAD) method. The properties of deposited TiN films are analyzed by means of multiple characterization tools.

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Bibliographic Details
Main Author: Wang, Jun Min.
Other Authors: Mei, Ting
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/3668
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Institution: Nanyang Technological University
Description
Summary:This thesis systematically studies the electrical and thermal properties of TiN films deposited by the filtered arc deposition (FAD) method. The properties of deposited TiN films are analyzed by means of multiple characterization tools.