Material characterization using electron beam induced current
This research work presented in this thesis is concerned with the determination of material parameters of a semiconductor specimen from the EBIC signals.
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sg-ntu-dr.10356-37622023-07-04T16:28:05Z Material characterization using electron beam induced current Wu, Det Hau. Ong, Vincent Keng Sian School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Electronic apparatus and materials This research work presented in this thesis is concerned with the determination of material parameters of a semiconductor specimen from the EBIC signals. Doctor of Philosophy (EEE) 2008-09-17T09:37:00Z 2008-09-17T09:37:00Z 2003 2003 Thesis http://hdl.handle.net/10356/3762 Nanyang Technological University application/pdf |
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DRNTU::Engineering::Electrical and electronic engineering::Electronic apparatus and materials Wu, Det Hau. Material characterization using electron beam induced current |
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This research work presented in this thesis is concerned with the determination of material parameters of a semiconductor specimen from the EBIC signals. |
author2 |
Ong, Vincent Keng Sian |
author_facet |
Ong, Vincent Keng Sian Wu, Det Hau. |
format |
Theses and Dissertations |
author |
Wu, Det Hau. |
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Wu, Det Hau. |
title |
Material characterization using electron beam induced current |
title_short |
Material characterization using electron beam induced current |
title_full |
Material characterization using electron beam induced current |
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Material characterization using electron beam induced current |
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Material characterization using electron beam induced current |
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material characterization using electron beam induced current |
publishDate |
2008 |
url |
http://hdl.handle.net/10356/3762 |
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1772826844839542784 |