Device parameters characterization with the use of EBIC
The performance of bipolar and photodiode devices is determined by the transport properties of the minority carriers, such as the minority carrier diffusion lengths and the surface recombination velocities. The Electron Beam Induced Current (EBIC) technique of the Scanning Electron Microscopy (SEM)...
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| 格式: | Theses and Dissertations |
| 語言: | English |
| 出版: |
2010
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| 在線閱讀: | https://hdl.handle.net/10356/41843 |
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| 機構: | Nanyang Technological University |
| 語言: | English |