Thermal conductivity measurement of thin films and bulk materials by 3 omega method

This final year project presents the thermal conductivity characterization of Silicon bulk substrate and several thin films such as Silicon dioxide, amorphous Carbon films and Bismuth telluride using the 3-Omega technique. We firstly study the theoretical concept of the 3-Omega method as well as...

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書目詳細資料
主要作者: Tham, Wai Hoe.
其他作者: Tay Beng Kang
格式: Final Year Project
語言:English
出版: 2011
主題:
在線閱讀:http://hdl.handle.net/10356/45353
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機構: Nanyang Technological University
語言: English