Thermal conductivity measurements and modeling of thin films
In order to study thermal conductivities of ta-C and SiC>2 thin films, the PPR system was developed. The analytical expression applied for data extraction was obtained from the transmission-line theory of heat conduction. The latter was originated from Hui and Tan [S.l] and is now extended to inc...
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| 格式: | Theses and Dissertations |
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2008
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| 在線閱讀: | http://hdl.handle.net/10356/4286 |
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