Thermal conductivity measurements and modeling of thin films

In order to study thermal conductivities of ta-C and SiC>2 thin films, the PPR system was developed. The analytical expression applied for data extraction was obtained from the transmission-line theory of heat conduction. The latter was originated from Hui and Tan [S.l] and is now extended to inc...

Full description

Saved in:
Bibliographic Details
Main Author: Chung, George Kit Chen.
Other Authors: Hui, Ping
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/4286
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University