Scanning near-field infrared microscopy

• Main Author: Chua, Alvin Rui Song.
• Other Authors: School of Electrical and Electronic Engineering
• Format: Final Year Project
• Language: English
• Published: 2011
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Electronic apparatus and materials
• Online Access: http://hdl.handle.net/10356/45465
• Institution: Nanyang Technological University

The main purpose of this final year project is to setup a Near-field Infrared Microscopy (SNIM) and to obtain a SNIM image with lateral resolution of 100nm. This is then reinforced by material characterization in term of nano scales with the use of infrared technology. The approach is to firs...