Variability study of nanowire: a compact model application

57 p.

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Bibliographic Details
Main Author:	Machavolu Kamakshi Srikanth
Other Authors:	Zhou Xing
Format:	Theses and Dissertations
Published:	2011
Subjects:	DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics
Online Access:	http://hdl.handle.net/10356/46755
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Institution:	Nanyang Technological University

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spelling	sg-ntu-dr.10356-467552023-07-04T15:46:45Z Variability study of nanowire: a compact model application Machavolu Kamakshi Srikanth Zhou Xing School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics 57 p. In this work, figures of merits (FOM), such as Ion, I0fr, Gm, Gd, are studied using ananowire compact model which is non-binnable with minimal physically meaningful parameters. Statistical theories are applied to the mathematical compact model for describing major transistor FOM's and their bias/geometry dependencies. Further, the sensitivities of these FOMs to the geometry and biasvariations are computed and their impacts on variances of the target parameters are computed using certain statistical models. Finally, the computed statistics are verified by performing Monte Carlo circuit simulations using a Nanowire Compact Model. This study provides a useful tool and a guideline in analysing circuit and device FOM's of MOSFET which would be useful for probabilistic CMOS design paradigms that exploit randomness in futuristic devices by taking advantage of probabilistic behaviours into chip designs. Master of Science (Electronics) 2011-12-23T07:43:57Z 2011-12-23T07:43:57Z 2011 Thesis http://hdl.handle.net/10356/46755 Nanyang Technological University application/pdf
institution	Nanyang Technological University
building	NTU Library
continent	Asia
country	Singapore Singapore
content_provider	NTU Library
collection	DR-NTU
topic	DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics
spellingShingle	DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics Machavolu Kamakshi Srikanth Variability study of nanowire: a compact model application
description	57 p.
author2	Zhou Xing
author_facet	Zhou Xing Machavolu Kamakshi Srikanth
format	Theses and Dissertations
author	Machavolu Kamakshi Srikanth
author_sort	Machavolu Kamakshi Srikanth
title	Variability study of nanowire: a compact model application
title_short	Variability study of nanowire: a compact model application
title_full	Variability study of nanowire: a compact model application
title_fullStr	Variability study of nanowire: a compact model application
title_full_unstemmed	Variability study of nanowire: a compact model application
title_sort	variability study of nanowire: a compact model application
publishDate	2011
url	http://hdl.handle.net/10356/46755
_version_	1772828695308795904

Variability study of nanowire: a compact model application

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