Application of low frequency noise in the study of VLSI electromigration

The objective of this project are I) to propose a systematic procedure of low-frequency noise measurement analysis to ensure the validation of the obtained result and its conclusion. Ii) to study the possible electromigration noise source among various diffusion paths of electromigration fluxes.

Saved in:

Bibliographic Details
Main Author:	Lim, Shin Yeh.
Other Authors:	Tan, Cher Ming
Format:	Theses and Dissertations
Published:	2008
Subjects:	DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
Online Access:	http://hdl.handle.net/10356/4688
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	Nanyang Technological University

id	sg-ntu-dr.10356-4688
record_format	dspace
spelling	sg-ntu-dr.10356-46882023-07-04T15:57:49Z Application of low frequency noise in the study of VLSI electromigration Lim, Shin Yeh. Tan, Cher Ming School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Microelectronics The objective of this project are I) to propose a systematic procedure of low-frequency noise measurement analysis to ensure the validation of the obtained result and its conclusion. Ii) to study the possible electromigration noise source among various diffusion paths of electromigration fluxes. Master of Engineering 2008-09-17T09:56:38Z 2008-09-17T09:56:38Z 2002 2002 Thesis http://hdl.handle.net/10356/4688 Nanyang Technological University application/pdf
institution	Nanyang Technological University
building	NTU Library
continent	Asia
country	Singapore Singapore
content_provider	NTU Library
collection	DR-NTU
topic	DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
spellingShingle	DRNTU::Engineering::Electrical and electronic engineering::Microelectronics Lim, Shin Yeh. Application of low frequency noise in the study of VLSI electromigration
description	The objective of this project are I) to propose a systematic procedure of low-frequency noise measurement analysis to ensure the validation of the obtained result and its conclusion. Ii) to study the possible electromigration noise source among various diffusion paths of electromigration fluxes.
author2	Tan, Cher Ming
author_facet	Tan, Cher Ming Lim, Shin Yeh.
format	Theses and Dissertations
author	Lim, Shin Yeh.
author_sort	Lim, Shin Yeh.
title	Application of low frequency noise in the study of VLSI electromigration
title_short	Application of low frequency noise in the study of VLSI electromigration
title_full	Application of low frequency noise in the study of VLSI electromigration
title_fullStr	Application of low frequency noise in the study of VLSI electromigration
title_full_unstemmed	Application of low frequency noise in the study of VLSI electromigration
title_sort	application of low frequency noise in the study of vlsi electromigration
publishDate	2008
url	http://hdl.handle.net/10356/4688
_version_	1772828713824550912

Application of low frequency noise in the study of VLSI electromigration

Similar Items