Analysis and design of test pattern generator based on functional memory test algorithm for the burn-in process

The main objective of this project is to analyze one of the functional memory test algorithm, named March tests, which are applied to Random Access Memory for detecting most common faults. Based on this integrated test method, a Driver board that contains Test Pattern Generator as well as auxilliary...

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Bibliographic Details
Main Author:	Luo, Qi.
Other Authors:	Wang, Jianliang
Format:	Theses and Dissertations
Published:	2008
Subjects:	DRNTU::Engineering::Electrical and electronic engineering::Semiconductors
Online Access:	http://hdl.handle.net/10356/4831
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Institution:	Nanyang Technological University

id	sg-ntu-dr.10356-4831
record_format	dspace
spelling	sg-ntu-dr.10356-48312023-07-04T15:10:14Z Analysis and design of test pattern generator based on functional memory test algorithm for the burn-in process Luo, Qi. Wang, Jianliang School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Semiconductors The main objective of this project is to analyze one of the functional memory test algorithm, named March tests, which are applied to Random Access Memory for detecting most common faults. Based on this integrated test method, a Driver board that contains Test Pattern Generator as well as auxilliary circuitry is designed for March test operation. Master of Science (Computer Control and Automation) 2008-09-17T09:59:32Z 2008-09-17T09:59:32Z 2001 2001 Thesis http://hdl.handle.net/10356/4831 Nanyang Technological University application/pdf
institution	Nanyang Technological University
building	NTU Library
continent	Asia
country	Singapore Singapore
content_provider	NTU Library
collection	DR-NTU
topic	DRNTU::Engineering::Electrical and electronic engineering::Semiconductors
spellingShingle	DRNTU::Engineering::Electrical and electronic engineering::Semiconductors Luo, Qi. Analysis and design of test pattern generator based on functional memory test algorithm for the burn-in process
description	The main objective of this project is to analyze one of the functional memory test algorithm, named March tests, which are applied to Random Access Memory for detecting most common faults. Based on this integrated test method, a Driver board that contains Test Pattern Generator as well as auxilliary circuitry is designed for March test operation.
author2	Wang, Jianliang
author_facet	Wang, Jianliang Luo, Qi.
format	Theses and Dissertations
author	Luo, Qi.
author_sort	Luo, Qi.
title	Analysis and design of test pattern generator based on functional memory test algorithm for the burn-in process
title_short	Analysis and design of test pattern generator based on functional memory test algorithm for the burn-in process
title_full	Analysis and design of test pattern generator based on functional memory test algorithm for the burn-in process
title_fullStr	Analysis and design of test pattern generator based on functional memory test algorithm for the burn-in process
title_full_unstemmed	Analysis and design of test pattern generator based on functional memory test algorithm for the burn-in process
title_sort	analysis and design of test pattern generator based on functional memory test algorithm for the burn-in process
publishDate	2008
url	http://hdl.handle.net/10356/4831
_version_	1772827447687905280

Analysis and design of test pattern generator based on functional memory test algorithm for the burn-in process

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