Analysis and design of test pattern generator based on functional memory test algorithm for the burn-in process

• Main Author: Luo, Qi.
• Other Authors: Wang, Jianliang
• Format: Theses and Dissertations
• Published: 2008
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Semiconductors
• Online Access: http://hdl.handle.net/10356/4831
• Institution: Nanyang Technological University

The main objective of this project is to analyze one of the functional memory test algorithm, named March tests, which are applied to Random Access Memory for detecting most common faults. Based on this integrated test method, a Driver board that contains Test Pattern Generator as well as auxilliary...