Effects of electric field on XPS measurements.
X-ray Photoelectron Spectroscopy is a widely used technique in analyzing the chemical state of a material. However, the presence of a potential difference in the material often complicates analysis. This can lead to erroneous attribution of peak binding energy that results in wrong analysis of the p...
Saved in:
Main Author: | Lek, Sunny Han Liang. |
---|---|
Other Authors: | School of Physical and Mathematical Sciences |
Format: | Final Year Project |
Language: | English |
Published: |
2012
|
Subjects: | |
Online Access: | http://hdl.handle.net/10356/49104 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
Similar Items
-
UPS and XPS study of annealed and unannealed poly-3-hexyl-thiophene.
by: Kwan, Yue Chau.
Published: (2011) -
Adsorbate electric fields on a cryogenic atom chip
by: Chan, K. S., et al.
Published: (2014) -
Probing electronic structures of graphene under magnetic field and electric field by Raman spectroscopy
by: Shen, Xiaonan
Published: (2015) -
Electric-field-induced three-terminal pMTJ switching in the absence of an external magnetic field
by: Deng, Jiefang, et al.
Published: (2019) -
Electric field driven phase transition and possible twining quasi-tetragonal phase in compressively strained BiFeO3 thin films
by: Lu, Cheng-Liang, et al.
Published: (2013)