Characterization and modeling of on-chip interconnects for silicon RFIC design

The characterization and modelling of on-chip interconnects had been carried out in this project. First, an overview of the on-chip interconnect on lossy silicon-based process is presented. Second, on-wafer high frequency measurements of the on-chip interconnects are carried out and investigated in...

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Bibliographic Details
Main Author: Ong, Beng Hwee
Other Authors: Yeo Kiat Seng
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:https://hdl.handle.net/10356/4991
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Institution: Nanyang Technological University