Characterization and modeling of on-chip interconnects for silicon RFIC design

The characterization and modelling of on-chip interconnects had been carried out in this project. First, an overview of the on-chip interconnect on lossy silicon-based process is presented. Second, on-wafer high frequency measurements of the on-chip interconnects are carried out and investigated in...

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Main Author: Ong, Beng Hwee
Other Authors: Yeo Kiat Seng
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:https://hdl.handle.net/10356/4991
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Institution: Nanyang Technological University
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spelling sg-ntu-dr.10356-49912023-07-04T17:00:18Z Characterization and modeling of on-chip interconnects for silicon RFIC design Ong, Beng Hwee Yeo Kiat Seng School of Electrical and Electronic Engineering Ma Jian-Guo DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits The characterization and modelling of on-chip interconnects had been carried out in this project. First, an overview of the on-chip interconnect on lossy silicon-based process is presented. Second, on-wafer high frequency measurements of the on-chip interconnects are carried out and investigated in depth. MASTER OF ENGINEERING (EEE) 2008-09-17T10:02:50Z 2008-09-17T10:02:50Z 2005 2005 Thesis Ong, B. H. (2005). Characterization and modeling of on-chip interconnects for silicon RFIC design. Master’s thesis, Nanyang Technological University, Singapore. https://hdl.handle.net/10356/4991 10.32657/10356/4991 Nanyang Technological University application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
topic DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits
Ong, Beng Hwee
Characterization and modeling of on-chip interconnects for silicon RFIC design
description The characterization and modelling of on-chip interconnects had been carried out in this project. First, an overview of the on-chip interconnect on lossy silicon-based process is presented. Second, on-wafer high frequency measurements of the on-chip interconnects are carried out and investigated in depth.
author2 Yeo Kiat Seng
author_facet Yeo Kiat Seng
Ong, Beng Hwee
format Theses and Dissertations
author Ong, Beng Hwee
author_sort Ong, Beng Hwee
title Characterization and modeling of on-chip interconnects for silicon RFIC design
title_short Characterization and modeling of on-chip interconnects for silicon RFIC design
title_full Characterization and modeling of on-chip interconnects for silicon RFIC design
title_fullStr Characterization and modeling of on-chip interconnects for silicon RFIC design
title_full_unstemmed Characterization and modeling of on-chip interconnects for silicon RFIC design
title_sort characterization and modeling of on-chip interconnects for silicon rfic design
publishDate 2008
url https://hdl.handle.net/10356/4991
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