Surface and subsurface damage investigation and CFD modeling of CMP for optical silicon substrate
Precision optics and photonic applications using silicon substrates nowadays demand high production efficiency with nano-level surface quality and shallow sub-surface damage. Modem machining technologies need to evolve further to not only improve surface quality but also subsurface morphology. In th...
Saved in:
主要作者: | |
---|---|
其他作者: | |
格式: | Theses and Dissertations |
語言: | English |
出版: |
2013
|
主題: | |
在線閱讀: | http://hdl.handle.net/10356/53144 |
標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|