Surface and subsurface damage investigation and CFD modeling of CMP for optical silicon substrate

Precision optics and photonic applications using silicon substrates nowadays demand high production efficiency with nano-level surface quality and shallow sub-surface damage. Modem machining technologies need to evolve further to not only improve surface quality but also subsurface morphology. In th...

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書目詳細資料
主要作者: Srinivasan, Kaushik.
其他作者: Zhong Zhaowei
格式: Theses and Dissertations
語言:English
出版: 2013
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在線閱讀:http://hdl.handle.net/10356/53144
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