Raman spectroscopy characterization of carbon thin films

• المؤلف الرئيسي: Lim, Yaw Keong.
• مؤلفون آخرون: Tay Beng Kang
• التنسيق: Final Year Project
• اللغة: English
• منشور في: 2013
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/53367
• المؤسسة: Nanyang Technological University

It is an essential to characterise the carbon samples as a start up for further research on the thermal conductivity of these carbon samples. As this will reduces the time of finding out the details of the Raman Spectrum of the carbon thin film. All the amorphous carbon thin films were grown using F...