Study of leakage and degradation in metal nanocrystal-embedded gate stacks

• Main Author: Lwin, Zin Zar
• Other Authors: Pey Kin Leong
• Format: Theses and Dissertations
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/53456
• Institution: Nanyang Technological University

Nanocrystal (NC) memories have attracted a lot of research attentions as a promising candidate to reduce defect-related charge loss and to overcome scaling limitation in conventional floating gate memories. Most work on metal nanocrystal (MNC) has focused primarily on the materials and fabrication i...