Study of leakage and degradation in metal nanocrystal-embedded gate stacks

• 主要作者: Lwin, Zin Zar
• 其他作者: Pey Kin Leong
• 格式: Theses and Dissertations
• 語言: English
• 出版: 2013
• 主題: DRNTU::Engineering::Electrical and electronic engineering
• 在線閱讀: https://hdl.handle.net/10356/53456

Nanocrystal (NC) memories have attracted a lot of research attentions as a promising candidate to reduce defect-related charge loss and to overcome scaling limitation in conventional floating gate memories. Most work on metal nanocrystal (MNC) has focused primarily on the materials and fabrication i...