Optical monitoring of time-dependent topographies in microfabrication

The main aim of this project was to develop methodology using existing patented CDH system to monitor time-dependent topographies in microfabrication, particularly in wet chemical etching. To achieve this aim, an actual etch rate was predetermined through experiments and will be used as a reference...

Full description

Saved in:
Bibliographic Details
Main Author: Leng, Yilong.
Other Authors: Anand Krishna Asundi
Format: Final Year Project
Language:English
Published: 2013
Subjects:
Online Access:http://hdl.handle.net/10356/54149
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
Language: English

Similar Items