Leakage reduction techniques for submicron CMOS circuits

• Main Author: Teo, Serene.
• Other Authors: Lau Kim Teen
• Format: Final Year Project
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: http://hdl.handle.net/10356/54459
• Institution: Nanyang Technological University

Leakage current has become a significant problem in sub-micron circuits due to the continuous scaling of channel length. Therefore, leakage reduction has become an essential design process in order to achieve a better performance especially in low power circuit applications. Leakage cont...