Design for reliability through engineering optimization

• المؤلف الرئيسي: Ng, Wee Loon
• مؤلفون آخرون: Tan Chuan Seng
• التنسيق: Theses and Dissertations
• اللغة: English
• منشور في: 2015
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/63945

The pursuit of Moore’s Law, in term of improving transistor performance, simply by reducing transistor geometry (e.g. oxide thickness reduction, gate length reduction etc.) has come under technical challenge of meeting the performance requirement since the 130nm technology node. (e.g. copper interco...