Design for reliability through engineering optimization

• Main Author: Ng, Wee Loon
• Other Authors: Tan Chuan Seng
• Format: Theses and Dissertations
• Language: English
• Published: 2015
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
• Online Access: http://hdl.handle.net/10356/63945
• Institution: Nanyang Technological University

The pursuit of Moore’s Law, in term of improving transistor performance, simply by reducing transistor geometry (e.g. oxide thickness reduction, gate length reduction etc.) has come under technical challenge of meeting the performance requirement since the 130nm technology node. (e.g. copper interco...