Design for reliability through engineering optimization

• 主要作者: Ng, Wee Loon
• 其他作者: Tan Chuan Seng
• 格式: Theses and Dissertations
• 語言: English
• 出版: 2015
• 主題: DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
• 在線閱讀: http://hdl.handle.net/10356/63945

The pursuit of Moore’s Law, in term of improving transistor performance, simply by reducing transistor geometry (e.g. oxide thickness reduction, gate length reduction etc.) has come under technical challenge of meeting the performance requirement since the 130nm technology node. (e.g. copper interco...