Characteristics and analysis of high speed InGaAs/InP uni-traveling-carrier photodiodes (UTC-PD)

With the development of broadband and high-frequency photonic systems, the photodiode with both high output power and high speed operating characteristics becomes attracti ve. The novel uni-traveling-carrier photodiode (UTC-PD) can realize these characteristics simultaneously. Compared with...

Full description

Saved in:
Bibliographic Details
Main Author: Li, Mengqiong
Other Authors: School of Electrical and Electronic Engineering
Format: Theses and Dissertations
Language:English
Published: 2015
Subjects:
Online Access:http://hdl.handle.net/10356/64768
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
Language: English
id sg-ntu-dr.10356-64768
record_format dspace
spelling sg-ntu-dr.10356-647682023-07-04T15:23:28Z Characteristics and analysis of high speed InGaAs/InP uni-traveling-carrier photodiodes (UTC-PD) Li, Mengqiong School of Electrical and Electronic Engineering DRNTU::Engineering With the development of broadband and high-frequency photonic systems, the photodiode with both high output power and high speed operating characteristics becomes attracti ve. The novel uni-traveling-carrier photodiode (UTC-PD) can realize these characteristics simultaneously. Compared with conventional photodiodes, this superior device improves the device performance in photonic system owing to its unique structure whose active region comprises a neutral or p-type narrow-gap light absorption layer and an undoped or slightly n-type wide-gap carrier collection layer. By adopting thi s structure, the photoresponse of UTC-PD is solely contributed by electrons whose transmit velocity is an order of magnitude faster than that of holes. As a consequence, the device demonstrates high performance of higher-speed operation as well as high-output saturation current. However, although UTC-PDs already show superior features, most of the InP-based UTC-PDs still need InGaAsP compositional graded quaternary structures at InGaAs and InP interface to smoothen the bandgap discontinuity. Consequently, the fabrication process and growth of materials will become more difficult and complicated. In order to resolve this limitation of intrinsic tradeoff between device's performance and growth as well as process complexity, a UTC-PD with dipoledoped interface layer is proposed in this work. Furthermore, a thicker collection layer of 350 nm is employed to obtain better performance. By measuring this photodiode with its dark current, series resistance, bandwidth and photocurrent, we can conclude that it shows excellent performances. To be specific, the device can reach a high 3-dB bandwidth of 570Hz under a constant optical power of 100 m Wand a reverse bias voltage of 6V. Master of Science (Electronics) 2015-06-04T01:43:43Z 2015-06-04T01:43:43Z 2014 2014 Thesis http://hdl.handle.net/10356/64768 en 64 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering
spellingShingle DRNTU::Engineering
Li, Mengqiong
Characteristics and analysis of high speed InGaAs/InP uni-traveling-carrier photodiodes (UTC-PD)
description With the development of broadband and high-frequency photonic systems, the photodiode with both high output power and high speed operating characteristics becomes attracti ve. The novel uni-traveling-carrier photodiode (UTC-PD) can realize these characteristics simultaneously. Compared with conventional photodiodes, this superior device improves the device performance in photonic system owing to its unique structure whose active region comprises a neutral or p-type narrow-gap light absorption layer and an undoped or slightly n-type wide-gap carrier collection layer. By adopting thi s structure, the photoresponse of UTC-PD is solely contributed by electrons whose transmit velocity is an order of magnitude faster than that of holes. As a consequence, the device demonstrates high performance of higher-speed operation as well as high-output saturation current. However, although UTC-PDs already show superior features, most of the InP-based UTC-PDs still need InGaAsP compositional graded quaternary structures at InGaAs and InP interface to smoothen the bandgap discontinuity. Consequently, the fabrication process and growth of materials will become more difficult and complicated. In order to resolve this limitation of intrinsic tradeoff between device's performance and growth as well as process complexity, a UTC-PD with dipoledoped interface layer is proposed in this work. Furthermore, a thicker collection layer of 350 nm is employed to obtain better performance. By measuring this photodiode with its dark current, series resistance, bandwidth and photocurrent, we can conclude that it shows excellent performances. To be specific, the device can reach a high 3-dB bandwidth of 570Hz under a constant optical power of 100 m Wand a reverse bias voltage of 6V.
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Li, Mengqiong
format Theses and Dissertations
author Li, Mengqiong
author_sort Li, Mengqiong
title Characteristics and analysis of high speed InGaAs/InP uni-traveling-carrier photodiodes (UTC-PD)
title_short Characteristics and analysis of high speed InGaAs/InP uni-traveling-carrier photodiodes (UTC-PD)
title_full Characteristics and analysis of high speed InGaAs/InP uni-traveling-carrier photodiodes (UTC-PD)
title_fullStr Characteristics and analysis of high speed InGaAs/InP uni-traveling-carrier photodiodes (UTC-PD)
title_full_unstemmed Characteristics and analysis of high speed InGaAs/InP uni-traveling-carrier photodiodes (UTC-PD)
title_sort characteristics and analysis of high speed ingaas/inp uni-traveling-carrier photodiodes (utc-pd)
publishDate 2015
url http://hdl.handle.net/10356/64768
_version_ 1772826889247784960