Feature extraction for defect classification

This research project aims to determine the best method of image classification of the different defect types with high accuracy using Support Vector Machine (SVM) for classification. In the first experiment, features are extracted from defect images by convolving the image with Root Filter Set...

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書目詳細資料
主要作者: Chen, Gary Yan Hong
其他作者: Ho Shen Shyang
格式: Final Year Project
語言:English
出版: 2016
主題:
在線閱讀:http://hdl.handle.net/10356/66657
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機構: Nanyang Technological University
語言: English