Feature extraction for defect classification

• Main Author: Chen, Gary Yan Hong
• Other Authors: Ho Shen Shyang
• Format: Final Year Project
• Language: English
• Published: 2016
• Subjects: DRNTU::Engineering
• Online Access: http://hdl.handle.net/10356/66657
• Institution: Nanyang Technological University

This research project aims to determine the best method of image classification of the different defect types with high accuracy using Support Vector Machine (SVM) for classification. In the first experiment, features are extracted from defect images by convolving the image with Root Filter Set...