Feature extraction for defect classification
This research project aims to determine the best method of image classification of the different defect types with high accuracy using Support Vector Machine (SVM) for classification. In the first experiment, features are extracted from defect images by convolving the image with Root Filter Set...
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主要作者: | Chen, Gary Yan Hong |
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其他作者: | Ho Shen Shyang |
格式: | Final Year Project |
語言: | English |
出版: |
2016
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主題: | |
在線閱讀: | http://hdl.handle.net/10356/66657 |
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