The best of both worlds: integrating semantic features with expert features for defect prediction and localization
To improve software quality, just-in-time defect prediction (JIT-DP) (identifying defect-inducing commits) and just-in-time defect localization (JIT-DL) (identifying defect-inducing code lines in commits) have been widely studied by learning semantic features or expert features respectively, and ind...
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| Main Authors: | , , , , , |
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| Format: | text |
| Language: | English |
| Published: |
Institutional Knowledge at Singapore Management University
2022
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| Subjects: | |
| Online Access: | https://ink.library.smu.edu.sg/sis_research/7729 |
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| Institution: | Singapore Management University |
| Language: | English |