The best of both worlds: integrating semantic features with expert features for defect prediction and localization

To improve software quality, just-in-time defect prediction (JIT-DP) (identifying defect-inducing commits) and just-in-time defect localization (JIT-DL) (identifying defect-inducing code lines in commits) have been widely studied by learning semantic features or expert features respectively, and ind...

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Bibliographic Details
Main Authors: NI, Chao, WANG, Wei, YANG, Kaiwen, XIA, Xin, LIU, Kui, LO, David
Format: text
Language:English
Published: Institutional Knowledge at Singapore Management University 2022
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Online Access:https://ink.library.smu.edu.sg/sis_research/7729
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Institution: Singapore Management University
Language: English

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