The best of both worlds: integrating semantic features with expert features for defect prediction and localization

• Main Authors: NI, Chao, WANG, Wei, YANG, Kaiwen, XIA, Xin, LIU, Kui, LO, David
• Format: text
• Language: English
• Published: Institutional Knowledge at Singapore Management University 2022
• Subjects: Software Engineering
• Online Access: https://ink.library.smu.edu.sg/sis_research/7729
• Institution: Singapore Management University

To improve software quality, just-in-time defect prediction (JIT-DP) (identifying defect-inducing commits) and just-in-time defect localization (JIT-DL) (identifying defect-inducing code lines in commits) have been widely studied by learning semantic features or expert features respectively, and ind...