Feature extraction for defect classification

• المؤلف الرئيسي: Chen, Gary Yan Hong
• مؤلفون آخرون: Ho Shen Shyang
• التنسيق: Final Year Project
• اللغة: English
• منشور في: 2016
• الموضوعات: DRNTU::Engineering
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/66657
• المؤسسة: Nanyang Technological University

This research project aims to determine the best method of image classification of the different defect types with high accuracy using Support Vector Machine (SVM) for classification. In the first experiment, features are extracted from defect images by convolving the image with Root Filter Set...