Development of automatic polishing for failure analysis of large microchips

• Main Author: Lee, Gerald Wei Hui
• Other Authors: Gan Chee Lip
• Format: Final Year Project
• Language: English
• Published: 2016
• Subjects: DRNTU::Engineering
• Online Access: http://hdl.handle.net/10356/68502
• Institution: Nanyang Technological University

Microelectronics failure analysis is important in determining the root causes of failure found in defective semiconductor packages. The true objective is to understand why the device fails, in an effort to implement corrective actions so as to ensure the functionality and reliability of such microel...