Development of automatic polishing for failure analysis of large microchips

• المؤلف الرئيسي: Lee, Gerald Wei Hui
• مؤلفون آخرون: Gan Chee Lip
• التنسيق: Final Year Project
• اللغة: English
• منشور في: 2016
• الموضوعات: DRNTU::Engineering
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/68502
• المؤسسة: Nanyang Technological University

Microelectronics failure analysis is important in determining the root causes of failure found in defective semiconductor packages. The true objective is to understand why the device fails, in an effort to implement corrective actions so as to ensure the functionality and reliability of such microel...