Development of automatic polishing for failure analysis of large microchips
Microelectronics failure analysis is important in determining the root causes of failure found in defective semiconductor packages. The true objective is to understand why the device fails, in an effort to implement corrective actions so as to ensure the functionality and reliability of such microel...
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| 格式: | Final Year Project |
| 語言: | English |
| 出版: |
2016
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| 主題: | |
| 在線閱讀: | http://hdl.handle.net/10356/68502 |
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| 機構: | Nanyang Technological University |
| 語言: | English |