Study of sputtered tin schottky barrier diode for Gan-hemt applications

During the past two decades, GaN-based high electron mobility transistor (HEMT) has been identified to be a very promising transistor that is able to realize the applications of high voltage, high frequency, and high temperature and has drawn much research interest around the world. More recently, G...

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Bibliographic Details
Main Author: Li, Kang
Other Authors: Ng Geok Ing
Format: Theses and Dissertations
Language:English
Published: 2016
Subjects:
Online Access:http://hdl.handle.net/10356/68961
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Institution: Nanyang Technological University
Language: English