The coexistence of write once read many memory and resistive memory in a single device of conjugated polymer

The thesis demonstrates for the first time coexistence of write once read many memory (WORM) with resistive random access memory (RRAM). This is the first time such coexistence phenomena are reported in organic materials system. Furthermore, better understanding of working mechanism in resistive...

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Main Author: Nguyen, Viet Cuong
Other Authors: Lee Pooi See
Format: Theses and Dissertations
Language:English
Published: 2017
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Online Access:http://hdl.handle.net/10356/72236
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-722362023-03-04T16:46:38Z The coexistence of write once read many memory and resistive memory in a single device of conjugated polymer Nguyen, Viet Cuong Lee Pooi See School of Materials Science & Engineering DRNTU::Engineering::Materials The thesis demonstrates for the first time coexistence of write once read many memory (WORM) with resistive random access memory (RRAM). This is the first time such coexistence phenomena are reported in organic materials system. Furthermore, better understanding of working mechanism in resistive switching phenomena in organic materials particularly conjugated polymer has been achieved. Two materials systems are chosen, namely, poly(3,4-ethylenedioxythiophene) polystyrene sulfonate (PEDOT PSS) and Polyvinyl alcohol (PVA) where PEDOT PSS is a conducting polymer and PVA is an insulator polymer. For a device with 5 μm thick PEDOT PSS sandwiched between two Au electrodes, the coexistence of WORM memory and RRAM memory can be achieved (Chapter 4). The WORM result was attributed to dedoping of the conducting PEDOT + PSS- segments to insulating PEDOT 0 segments. The RRAM was explained due to Proton H+ conductive properties of PSS acid domains inside the film after dedoping. This points to a general feature: resistive switching behavior of a whole device is the result of additive/summative resistive switching characteristic of its components. Based on this, we reveal the coexistence of RRAM memory and WORM memory demonstrated in PEDOT PSS blend with PVA (Chapter 5). The WORM memory is again attributed to PEDOT PSS while RRAM memory is attributed to the charge trapping characteristic of PVA. The device performance is improved significantly as compared to the earlier PEFOT PSS system, with more than 1000 cycling stability and much more than 10^4 s retention for RRAM mode. Additional I-V characteristic of this device is further studied in chapter 6 which reveals a new type of WORM memory. This type of WORM memory is driven by metallic migration of Au electrodes. Doctor of Philosophy (MSE) 2017-05-30T08:03:08Z 2017-05-30T08:03:08Z 2017 Thesis Nguyen, V. C. (2017). The coexistence of write once read many memory and resistive memory in a single device of conjugated polymer. Doctoral thesis, Nanyang Technological University, Singapore. http://hdl.handle.net/10356/72236 10.32657/10356/72236 en 110 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Materials
spellingShingle DRNTU::Engineering::Materials
Nguyen, Viet Cuong
The coexistence of write once read many memory and resistive memory in a single device of conjugated polymer
description The thesis demonstrates for the first time coexistence of write once read many memory (WORM) with resistive random access memory (RRAM). This is the first time such coexistence phenomena are reported in organic materials system. Furthermore, better understanding of working mechanism in resistive switching phenomena in organic materials particularly conjugated polymer has been achieved. Two materials systems are chosen, namely, poly(3,4-ethylenedioxythiophene) polystyrene sulfonate (PEDOT PSS) and Polyvinyl alcohol (PVA) where PEDOT PSS is a conducting polymer and PVA is an insulator polymer. For a device with 5 μm thick PEDOT PSS sandwiched between two Au electrodes, the coexistence of WORM memory and RRAM memory can be achieved (Chapter 4). The WORM result was attributed to dedoping of the conducting PEDOT + PSS- segments to insulating PEDOT 0 segments. The RRAM was explained due to Proton H+ conductive properties of PSS acid domains inside the film after dedoping. This points to a general feature: resistive switching behavior of a whole device is the result of additive/summative resistive switching characteristic of its components. Based on this, we reveal the coexistence of RRAM memory and WORM memory demonstrated in PEDOT PSS blend with PVA (Chapter 5). The WORM memory is again attributed to PEDOT PSS while RRAM memory is attributed to the charge trapping characteristic of PVA. The device performance is improved significantly as compared to the earlier PEFOT PSS system, with more than 1000 cycling stability and much more than 10^4 s retention for RRAM mode. Additional I-V characteristic of this device is further studied in chapter 6 which reveals a new type of WORM memory. This type of WORM memory is driven by metallic migration of Au electrodes.
author2 Lee Pooi See
author_facet Lee Pooi See
Nguyen, Viet Cuong
format Theses and Dissertations
author Nguyen, Viet Cuong
author_sort Nguyen, Viet Cuong
title The coexistence of write once read many memory and resistive memory in a single device of conjugated polymer
title_short The coexistence of write once read many memory and resistive memory in a single device of conjugated polymer
title_full The coexistence of write once read many memory and resistive memory in a single device of conjugated polymer
title_fullStr The coexistence of write once read many memory and resistive memory in a single device of conjugated polymer
title_full_unstemmed The coexistence of write once read many memory and resistive memory in a single device of conjugated polymer
title_sort coexistence of write once read many memory and resistive memory in a single device of conjugated polymer
publishDate 2017
url http://hdl.handle.net/10356/72236
_version_ 1759854231547805696