Design, verification and implementation of IEEE 1149.7 test access port

Standard access methods for Design for Testsbility (DfT) rely on the IEEE 1149.1 (JTAG) Test Access Port (TAP) controllers and associated collaterals. While the IEEE 1149.1 standard is a proven industry approach and has served the needs of DfT well, modern system on a chip (SoC) designs bring with i...

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Bibliographic Details
Main Author: Ganesh Janani
Other Authors: Gwee Bah Hwee
Format: Theses and Dissertations
Language:English
Published: 2018
Subjects:
Online Access:http://hdl.handle.net/10356/73131
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Institution: Nanyang Technological University
Language: English